NVRAM refactor, phase 1. (#18969)
* Rename `eeprom_stm32` to `eeprom_legacy_emulated_flash`. * Rename `flash_stm32` to `legacy_flash_ops`. * Rename `eeprom_teensy` to `eeprom_kinetis_flexram`.
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@@ -41,11 +41,11 @@ void eeprom_update_block(const void *__src, void *__dst, size_t __n);
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#elif defined(EEPROM_STM32_L0_L1)
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# include "eeprom_stm32_L0_L1.h"
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# define TOTAL_EEPROM_BYTE_COUNT (STM32_ONBOARD_EEPROM_SIZE)
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#elif defined(EEPROM_TEENSY)
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# include "eeprom_teensy.h"
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#elif defined(EEPROM_KINETIS_FLEXRAM)
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# include "eeprom_kinetis_flexram.h"
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# define TOTAL_EEPROM_BYTE_COUNT (EEPROM_SIZE)
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#elif defined(EEPROM_STM32_FLASH_EMULATED)
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# include "eeprom_stm32_defs.h"
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#elif defined(EEPROM_LEGACY_EMULATED_FLASH)
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# include "eeprom_legacy_emulated_flash_defs.h"
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# define TOTAL_EEPROM_BYTE_COUNT (FEE_DENSITY_BYTES)
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#elif defined(EEPROM_SAMD)
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# include "eeprom_samd.h"
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@@ -59,12 +59,12 @@ void eeprom_update_block(const void *__src, void *__dst, size_t __n);
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#elif defined(__AVR_AT90USB1286__) || defined(__AVR_AT90USB1287__)
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# define TOTAL_EEPROM_BYTE_COUNT 4096
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#elif defined(EEPROM_TEST_HARNESS)
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# ifndef FLASH_STM32_MOCKED
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# ifndef LEGACY_FLASH_OPS_MOCKED
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// Normal tests
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# define TOTAL_EEPROM_BYTE_COUNT 32
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# else
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// Flash wear-leveling testing
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# include "eeprom_stm32_tests.h"
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# include "eeprom_legacy_emulated_flash_tests.h"
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# define TOTAL_EEPROM_BYTE_COUNT (EEPROM_SIZE)
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# endif
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#else
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